Instrumental Development

Our group develops ultrahigh vacuum (UHV) measurement technology, such as high-resolution scanning tunneling microscopes (STMs). The STM’s are mostly fabricated within a diploma or master thesis. New developments include UHV-AFM/STMs operating at 0.4 K, high frequency STMs for time-resolved measurements down to 120 ps with atomic resolution, UHV-STMs with multiple contacts, tips for scanning tunneling microscopy in direct contact with GaAs wafers, as well as transport setups for UHV.

Recent Projects

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Scanning Tunneling Microscopy with 120ps Time Resolution
Vertical imaging in a scanning electron microscope (SEM)
InAs Nanowire Tips
He-3 Low-Temperature AFM/STM System with 14T Magnetic Field
Home built scanning tunneling microscopes. Left: Low temperature ultra high vacuum AFM/STM with Q-Plus sensor. Right: Low temperature high frequency STM designed for UHV and high magnetic fields. The time resolution is 120 ps. The microscope enables an in situ tip exchange.

Home built scanning tunneling microscopes. Left: Low temperature ultra high vacuum AFM/STM with Q-Plus sensor. Right: Low temperature high frequency STM designed for UHV and high magnetic fields. The time resolution is 120 ps. The microscope enables an in situ tip exchange.