In-situ x-ray reflectivity study of imprint in ferroelectric thin films
Cao, Jiang Li; Zhang, Kai; Solbach, Axel; Yue, Zhen Xing; Wang, Huang Hua; Chen, Yu; Klemradt, Uwe
Zürich-Stafa : Trans Tech Publ. (2011)
Journal Article
In: Materials science forum
Volume: 687
Page(s)/Article-Nr.: 292-296
Identifier
- DOI: 10.4028/www.scientific.net/MSF.687.292
- RWTH PUBLICATIONS: RWTH-CONV-012004