Effects of thermal annealing on the structure of ferroelectric thin films

Cao, Jiang-Li; Solbach, Axel; Klemradt, Uwe; Weirich, Thomas E.; Mayer, Joachim; Böttger, Ulrich; Ellerkmann, Ulrich; Schorn, Peter Jörg; Gerber, Peter; Waser, Rainer

Malden [u.a.] : Blackwell Publishing (2006)
Journal Article

In: Journal of the American Ceramic Society
Volume: 89
Issue: 4
Page(s)/Article-Nr.: 1321-1325