Growth-induced interface roughness of GaAs/AlAs-layers studied by x-ray scattering

Klemradt, Uwe; Funke, M.; Fromm, M.; Lengeler, Bruno; Preisl, J.; Förster, A.

Amsterdam : Elsevier (1996)
Journal Article

In: Physica / B, Condensed matter
Volume: 221
Issue: 1/4
Page(s)/Article-Nr.: 27-33

Identifier