In situ X-ray measurements over large Q-space to study the evolution of oxide thin films prepared by RF sputter deposition

Walter, P. (Corresponding author); Wernecke, J.; Scholz, M.; Reuther, D.; Rothkirch, A.; Haas, D.; Blume, J.; Resta, A.; Vlad, A.; Faley, Olga; Schipmann, Susanne; Nent, Alexander; Seeck, O.; Dippel, A.-C.; Klemradt, Uwe

Dordrecht [u.a.] : Springer Science + Business Media B.V (2020, 2021)
Journal Article

In: Journal of materials science
Volume: 56
Page(s)/Article-Nr.: 290-304