Microstructural Study of a Passivation Layer on GaAs : An Application of X-Ray Reflectivity Under Grazing Angles Using a Synchrotron Source

Crompton, K. E.; Finlayson, T. R.; Kirchner, C.; Seitz, M.; Klemradt, Uwe

Singapore : World Scientific Publ. (2003)
Journal Article

In: Surface review and letters : SRL
Volume: 10
Issue: 2/3
Page(s)/Article-Nr.: 373-379

Identifier