Intrinsic and extrinsic corrugation of monolayer graphene deposited on SiO2

Geringer, Viktor; Liebmann, Marcus; Echtermeyer, T.; Runte, S.; Schmidt, M.; Rückkamp, R.; Lemme, Max C.; Morgenstern, Markus

Ridge, NY : American Physical Society (2009)
Journal Article

In: Physical review letters : PRL
Volume: 102
Issue: 7
Page(s)/Article-Nr.: 076102