Intrinsic and extrinsic corrugation of monolayer graphene deposited on SiO2
Geringer, Viktor; Liebmann, Marcus; Echtermeyer, T.; Runte, S.; Schmidt, M.; Rückkamp, R.; Lemme, Max C.; Morgenstern, Markus
Ridge, NY : American Physical Society (2009)
Journal Article
In: Physical review letters : PRL
Volume: 102
Issue: 7
Page(s)/Article-Nr.: 076102
Identifier
- DOI: 10.1103/PhysRevLett.102.076102
- RWTH PUBLICATIONS: RWTH-CONV-059756