Fachzeitschriftenartikel
Marczinowski, J.; Wiebe, J.-M.; Tang, M.; Flatte, E.; Meier, F.; Morgenstern, Markus; Wiesendanger, Roland
Local Electronic Structure near Mn Acceptors in InAs: Surface-Induced Symmetry Breaking and Coupling to Host States
In: Physical review letters : PRL, 99 (2007), 15, 157202
[DOI: 10.1103/PhysRevLett.99.157202]

Fachzeitschriftenartikel
Cao, Jiang-Li; Solbach, Axel; Fang, Yan; Böttger, Ulrich; Schorn, Peter Jörg; Waser, Rainer; Klemradt, Uwe
Effects of thermal annealing on lead zirconate titanate thin film capacitors with platinum electrodes
In: Journal of the Electrochemical Society : JES, 154 (2007), 11, G251-G254
[DOI: 10.1149/1.2779954]

Beitrag zu einem Tagungsband, Fachzeitschriftenartikel
Müller, L.; Klemradt, Uwe; Finlayson, Trevor R.
Time-dependent phenomena in athermal martensitic transformations
In: Materials science & engineering / A, Structural materials: properties, microstructure and processing, 438/440 (2006), 122-125
[DOI: 10.1016/j.msea.2006.02.090]

Fachzeitschriftenartikel
Cao, Jiang-Li; Solbach, Axel; Klemradt, Uwe; Weirich, Thomas E.; Mayer, Joachim; Böttger, Ulrich; Schorn, Peter Jörg; Waser, Rainer
Density inhomogeneity in ferroelectric thin films
In: Applied physics letters, 89 (2006), 052901
[DOI: 10.1063/1.2244045]

Buchbeitrag
Morgenstern, Markus; Pirug, G.
H2O on metals
In: Numerical data and functional relationships in science and technology : new series / Landolt-Börnstein. Ed. in chief: W. Martienssen. - 3,42,A,5 : Group 3, Condensed matter : Vol. 42. Physics of covered solid surfaces : Subvol. A. Adsorbed layers on surfaces : Pt. 5 : Adsorption of molecules on metal, semiconductor and oxide surfaces / ed.: H.P. Bonzel. Authors: K. Christmann ... (2006), 133-168
[DOI: 10.1007/11364856_2]

Buchbeitrag
Morgenstern, Markus
Scanning Probe Microscopy on Low-Dimensional Electron Systems in III-V-Semiconductors
In: Scanning probe microscopy : electrical and electromechanical phenomena at the nanoscale / Sergei Kalinin ... eds.. - Vol. 1: Scanning probe microscopy : electrical and electromechanical phenomena at the nanoscale / Sergei Kalinin ... eds. (2006), 341-372
[DOI: 10.1007/978-0-387-28668-6_12]

Fachzeitschriftenartikel
Cao, Jiang-Li; Solbach, Axel; Klemradt, Uwe; Weirich, Thomas E.; Mayer, Joachim; Horn-Solle, Herbert; Böttger, Ulrich; Schorn, Peter Jörg; Schneller, Theodor; Waser, Rainer
Structural investigations of Pt/TiOx electrode stacks for ferroelectric thin film devices
In: Journal of applied physics, 99 (2006), 11, 114107
[DOI: 10.1063/1.2202015]

Fachzeitschriftenartikel
Cao, Jiang-Li; Solbach, Axel; Klemradt, Uwe; Weirich, Thomas E.; Mayer, Joachim; Böttger, Ulrich; Ellerkmann, Ulrich; Schorn, Peter Jörg; Gerber, Peter; Waser, Rainer
Effects of thermal annealing on the structure of ferroelectric thin films
In: Journal of the American Ceramic Society, 89 (2006), 4, 1321-1325
[DOI: 10.1111/j.1551-2916.2005.00885.x]

Fachzeitschriftenartikel
Cao, Jiang-Li; Solbach, Axel; Klemradt, Uwe
X-ray reflectivity studies of ferroelectric and dielectric multilayer structures
In: Physica / B, Condensed matter, 357 (2005), 1/2, 122-125
[DOI: 10.1016/j.physb.2004.11.039]

Buchbeitrag
Aspelmeyer, Martin; Klemradt, Uwe
Ferroelektrische Phasenumwandlungen
In: Effekte der Physik und ihre Anwendungen / hrsg. von Manfred von Ardenne ... (2004)

Buchbeitrag
Klemradt, Uwe
Martensitische Phasenumwandlungen
In: Effekte der Physik und ihre Anwendungen / hrsg. von Manfred von Ardenne ... (2004)

Fachzeitschriftenartikel
Crompton, K. E.; Finlayson, T. R.; Kirchner, C.; Seitz, M.; Klemradt, Uwe
Microstructural Study of a Passivation Layer on GaAs : An Application of X-Ray Reflectivity Under Grazing Angles Using a Synchrotron Source
In: Surface review and letters : SRL, 10 (2003), 2/3, 373-379
[DOI: 10.1142/S0218625X03004925]

Buchbeitrag
Röhlsberger, R.; Klemradt, Uwe
Collective excitations in low dimensions
In: Scientific Applications of XFEL Radiation, TESLA Technical Design Report, Teil V: The X-ray Free Electron Laser Hrsg. G. Materlik, G. Tschentscher (2001), 104-113

Buchbeitrag (Reference book entry)
Klemradt, Uwe
Phasenübergänge und kritische Phänomene
In: Lexikon der Physik : in sechs Bänden / Red.: Walter Greulich. - 4: Mi bis Sb / [Red.: Ulrich Kilian; Christine Weber] (2000), 246-251

Fachzeitschriftenartikel
Yang, P.; Klemradt, Uwe; Tao, Y.; Preisl, J.; Peng, R. W.; Jiang, S. S.
Long-term stability of a quasiperiodic Ta/Al multilayer: disintegration at room temperature analyzed by grazing angle x-ray scattering and photoelectron spectroscopy
In: Journal of applied physics, 86 (1999), 1/4, 267-274
[DOI: 10.1063/1.370725]

Buchbeitrag
Klemradt, Uwe
Kinetics of Metal-Gas Interactions at Low Temperatures
In: Kinetics of metal-gas interactions at low temperatures : hydriding, oxidation, poisoning / Eckehard Fromm (1998), 38-39

Fachzeitschriftenartikel
Klemradt, Uwe; Funke, M.; Fromm, M.; Lengeler, Bruno; Preisl, J.; Förster, A.
Growth-induced interface roughness of GaAs/AlAs-layers studied by x-ray scattering
In: Physica / B, Condensed matter, 221 (1996), 1/4, 27-33
[DOI: 10.1016/0921-4526(95)00901-9]

Buchbeitrag, Beitrag zu einem Tagungsband, Fachzeitschriftenartikel
Dederichs, P. H.; Drittler, B.; Klemradt, Uwe; Zeller, R.
Ab-initio calculations of vacancy formation and vacancy-solute interaction energies in metals
In: Materials science forum, 105/110 (1992), 31, 31-50
[DOI: 10.4028/www.scientific.net/MSF.105-110.31]

Buchbeitrag, Beitrag zu einem Tagungsband
Zeller, R.; Drittler, B.; Dederichs, P. H.; Klemradt, Uwe; Weinert, M.
Recent progress in electronic structure calculations for defects in metals
In: Computer aided innovation of new materials : proceedings of the First International Conference and Exhibition on Computer Applications to Materials Science and Engineering - CAMSE '90, Sunshine City, Ikebukuro, Tokyo, Japan, August 28 - 31, 1990 / ed. by Masao Doyama ... (1991), 269-274

Fachzeitschriftenartikel
Klemradt, Uwe; Drittler, B.; Zeller, R.; Dederichs, P. H.
Interaction energies of impurities in Cu and Ni
In: Physical review letters : PRL, 64 (1990), 23, 2803
[DOI: 10.1103/PhysRevLett.64.2803]