Probing fatigue in ferroelectric thin films with subnanometer depth resolution

Cao, Jiang-Li; Solbach, Axel; Klemradt, Uwe; Weirich, Thomas E.; Mayer, Joachim; Schorn, Peter Jörg; Böttger, Ulrich

Melville, N.Y : American Institute of Physics (2007)
Journal Article

In: Applied physics letters
Volume: 91
Issue: 7
Page(s)/Article-Nr.: 072905

Identifier