Analyzing multiple encounter as a possible origin of electron spin resonance signals in scanning tunneling microscopy on Si(111) featuring C and O defects

Manassen, Y. (Corresponding author); Averbukh, M.; Morgenstern, Markus

Amsterdam : Elsevier (2014)
Fachzeitschriftenartikel

In: Surface science
Band: 623
Seite(n)/Artikel-Nr.: 47-54