Scanning tunneling microscopy with InAs nanowire tips

Föhr, Kilian; Sladek, Kamil Przemyslaw; Günel, H. Yusuf; Lepsa, Mihail Ion; Hardtdegen, Hilde; Liebmann, Marcus; Schäpers, Thomas; Morgenstern, Markus

Melville, N.Y : American Institute of Physics [u.a.] (2012)
Journal Article

In: Applied physics letters
Volume: 101
Issue: 24
Page(s)/Article-Nr.: 243101

Identifier