Analyzing multiple encounter as a possible origin of electron spin resonance signals in scanning tunneling microscopy on Si(111) featuring C and O defects
Manassen, Y. (Corresponding author); Averbukh, M.; Morgenstern, Markus
Amsterdam : Elsevier (2014)
Journal Article
In: Surface science
Volume: 623
Page(s)/Article-Nr.: 47-54
Identifier
- DOI: 10.1016/j.susc.2013.12.009
- RWTH PUBLICATIONS: RWTH-CONV-085603