Analyzing multiple encounter as a possible origin of electron spin resonance signals in scanning tunneling microscopy on Si(111) featuring C and O defects

Manassen, Y. (Corresponding author); Averbukh, M.; Morgenstern, Markus

Amsterdam : Elsevier (2014)
Journal Article

In: Surface science
Volume: 623
Page(s)/Article-Nr.: 47-54

Identifier