Scanning Probe Microscopy on Low-Dimensional Electron Systems in III-V-Semiconductors

Morgenstern, Markus

Springer (2006)
Buchbeitrag

In: Scanning probe microscopy : electrical and electromechanical phenomena at the nanoscale / Sergei Kalinin ... eds.. - Vol. 1: Scanning probe microscopy : electrical and electromechanical phenomena at the nanoscale / Sergei Kalinin ... eds.
Seite(n)/Artikel-Nr.: 341-372

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